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Characterization of functional organic thin films by high resolution atomic force microscopy (B07)

Subject Area Experimental Condensed Matter Physics
Term from 2008 to 2017
Project identifier Deutsche Forschungsgemeinschaft (DFG) - Project number 49579428
 
Structural and chemical properties of organic/inorganic hybrid interfaces are studied by high resolution imaging and force spectroscopy. Molecular assemblies are imaged with sub-molecular resolution with functionalized probe tips. Molecule-substrate interactions and surface diffusion properties are studied by measuring forces during controlled manipulations of organic units. Due to the high technological relevance of the interface formation between functional organic layers and metal oxides (e.g. for organic semiconductor devices), we focus on this class of materials as substrates.
DFG Programme CRC/Transregios
Applicant Institution Universität Münster
 
 

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