Scanning Force Microscope (AFM)

• Subject Area: Condensed Matter Physics
• Term: Funded in 2024
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 545050087

The objective of this proposal is to secure funding for an advanced, research-grade atomic force microscope that will be crucial for the research in the group of the applicant. Additionally, it will be made available to the wider community at the Institute for Molecular Systems Engineering and Advanced Materials and Heidelberg University as part of a core facility for (nano)fabrication and characterization of thin-film and nano devices. If occupancy allows, the instrument will also be used in advanced teaching. Apart from topographic characterization of a wide range of samples, the microscope we look for will specifically be used for the characterization of (a) piezo- and ferroelectric properties; (b) electronic and ionic conductivity; (c) surface potentials and (d) mechanical properties. A significant fraction of the samples will be actual devices on large (3x3 cm or more) substrates that cannot be cut, for which reason we look for a large sample system. The majority of the materials to be probed will be soft to very soft organics, which necessitates measurement modes that allow the user to finely control and minimize the tip-sample interaction to avoid sample damage and tip contamination. Typical sizes of regions of interest range from a few tens of nanometers, where sub-nm lateral resolution is needed, to tens of micrometers, where scan speed (>>1 lines/sec) and fast but accurate feedback for large features (>100 nm, e.g. lithographic patterns) are important. Noise- and drift-free closed loop operation is a must, as is the possibility to control the sample temperature upwards from room temperature. As part of the preparation of this proposal, we have performed test measurements on a demanding but representative set of samples at the leading instrument suppliers. The results are summarized and evaluated in a separate document.

• DFG Programme: Major Research Instrumentation
• Major Instrumentation: Rasterkraftmikroskop
• Instrumentation Group: 5091 Rasterkraft-Mikroskope
• Applicant Institution: Ruprecht-Karls-Universität Heidelberg
• Leader: Professor Dr. Martijn Kemerink