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Theoretical an experimental investigation of noise in advanced SiGe BiCMOS process technologies

Subject Area Electronic Semiconductors, Components and Circuits, Integrated Systems, Sensor Technology, Theoretical Electrical Engineering
Term from 2005 to 2009
Project identifier Deutsche Forschungsgemeinschaft (DFG) - Project number 5445768
 
No abstract available
DFG Programme Research Grants
 
 

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