Ermittlung der Grenzflächen-Realstruktur mittels Röntgendiffraktometrie (YE 1)

• Subject Area: Condensed Matter Physics
• Term: from 1995 to 2000
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 5476519

No abstract available

• DFG Programme: Collaborative Research Centres
• Subproject of: SFB 296: Growth Correlated Properties of Low-Dimensional Semiconductor Structures
• Co-Applicant Institution: Humboldt-Universität zu Berlin
• Applicant Institution: Technische Universität Berlin
• Project Head: Professor Dr. Rolf Köhler