Analytic Field Emission Scanning Electron Microscope with Soft X-ray and Raman Spectrometer

• Subject Area: Chemical Solid State and Surface Research
• Term: Funded in 2021
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 464867041

At RWTH Aachen, high resolution scanning electron microscopy (SEM) is an indispensable method for extensive characterization of novel materials with respect to morphology, chemical and crystallographic microstructure. Scanning electron microscopes already installed at RWTH Aachen cannot cover the needs for characterizing energy materials, in particular concerning lithium as a low mass element and composites of inorganic and organic materials. Therefore, a state-of-the-art field emission SEM equipped with a detector for soft X-rays and a Raman spectrometer is requested.

• DFG Programme: Major Research Instrumentation
• Major Instrumentation: Rasterelektronenmikroskop mit Soft-X-Ray- und Ramanspektrometer
• Instrumentation Group: 5120 Rasterelektronenmikroskope (REM)
• Applicant Institution: Rheinisch-Westfälische Technische Hochschule Aachen
• Leader: Professor Dr. Ulrich Simon