X-Ray Diffraction Studies of 2D Materials (B02)

• Subject Area: Solid State and Surface Chemistry, Material Synthesis ; Analytical Chemistry ; Physical Chemistry of Solids and Surfaces, Material Characterisation
• Term: from 2020 to 2024
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 417590517

Geck’s project will determine the global average structure and local structural deviations for synthetic 2DMs by means of advanced surface X-ray diffraction techniques. Furthermore, the morphology of these materials will be characterized in terms of texture as well as domain and grain sizes. These experiments shall be done on few- and even monolayer systems, such as Zr-based MOFenes. To this end, surface X-ray diffraction will be combined with studies of the pair distribution function and diffuse scattering.

• DFG Programme: Collaborative Research Centres
• Subproject of: SFB 1415: Chemistry of Synthetic Two-Dimensional Materials
• Applicant Institution: Technische Universität Dresden
• Project Head: Professor Dr. Jochen Geck