Secondary Ion Mass Spectrometer

• Subject Area: Chemical Solid State and Surface Research
• Term: Funded in 2019
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 421580016

The core facility for analytics of the University Center for Materials Science (ZFM) of Justus Liebig University Giessen (JLU) shall be expanded and complemented by a new secondary ion mass spectrometer (Hybrid-SIMS). The Hybrid-SIMS is a secondary ion mass spectrometer equipped with a time-of-flight and an orbitrap mass analyzer. In the past, time of flight (ToF) analyzers have mainly dominated over other analyzer concepts, because of their versatility and their ability to detect all masses up to the se-lected upper mass limit in a relative short time. With ToF-SIMS it is possible to obtain complex compo-sitional 2D and 3D analyses quite quickly. Therefore it has become a standard analytical tool in materials science. However, the poor mass resolution of only up to FWHM m/delta m = 10,000 in standard opera-tion is a limiting factor in the field of organic analysis since this resolution is not sufficient to uniquely identify and allocate organic mass signals. Therefore, we apply for a ToF-SIMS machine of the newest generation that is additionally equipped with an orbitrap analyzer, which achieves mass resolutions of up to m/delta m = 280,000. The combination of both analyzers is essential as ToF measurements are very fast and needed for preselection of regions of interest for the relatively slow orbitrap measurements. The new device will be operated in the ZFM of the JLU Gießen and will cover the need for analyses in the field of organic functional materials at JLU. Users at the University of Applied Science of Central Hesse and Philipps University of Marburg will have access within the frame of the Research Campus Central Hesse (FCMH). The Hybrid-SIMS would enable (imaging) mass spectrometry at the highest international level in materials- and life sciences.

• DFG Programme: Major Research Instrumentation
• Major Instrumentation: Hybrid-Sekundärionenmassenspektrometer (Hybrid-SIMS)
• Instrumentation Group: 1720 Spezielle Massenspektrometer (Flugzeit-, Cyclotronresonanz-, Ionensonden, SIMS, außer 306)
• Applicant Institution: Justus-Liebig-Universität Gießen
• Leader: Professor Dr. Jürgen Janek